The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Oct. 09, 2007
Matthew Alun Brown, Seattle, WA (US);
Gang Hua, Kirkland, WA (US);
Simon A. J. Winder, Seattle, WA (US);
Matthew Alun Brown, Seattle, WA (US);
Gang Hua, Kirkland, WA (US);
Simon A. J. Winder, Seattle, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
To render the comparison of image patches more efficient, the data of an image patch can be projected into a smaller-dimensioned subspace, resulting in a descriptor of the image patch. The projection into the descriptor subspace is known as a linear discriminant embedding, and can be performed with reference to a linear discriminant embedding matrix. The linear discriminant embedding matrix can be constructed from projection vectors that maximize those elements that are shared by matching image patches or that are used to distinguish non-matching image patches, while also minimizing those elements that are common to non-matching image patches or that distinguish matching image patches. The determination of such projection vectors can be limited such that only orthogonal vectors comprise the linear discriminant embedding matrix. The determination of the linear discriminant embedding matrix can likewise be constrained to avoid overfitting to training data.