The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Nov. 26, 2007
Christian Blendl, Bergheim, DE;
Karl Lehi Schwartz, Pyrbaum, DE;
Christian Blendl, Bergheim, DE;
Karl Lehi Schwartz, Pyrbaum, DE;
Ion Beam Applications S.A., , BE;
Abstract
The present invention relates to a device and method for quality management () in a mammography apparatus (), said apparatus comprising an X-ray source capable of directing a X-ray beam, a breast immobilization means (), and an X-ray image sensor system (), said X-ray image sensor system () comprising a central area for sensing an image of said breast, and a peripheral area not used for imaging said immobilized breast. According to the invention, the device comprises a sensor for quality management (), said sensor comprising a radiation dose detector in the path of said X-ray beam, for producing a dose measurement, and radiation absorbing elements () for producing a detectable image of said X-ray beam on said X-ray image sensor system (), acquisition means () for acquiring a digital image of said breast, and of said sensor for quality management (), computing means () for computing quality management data () from said digital image of said sensor for quality management (), and from said dose measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile