The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Aug. 27, 2007
Applicants:
Nobunari Tsukamoto, Kanagawa, JP;
Hidetoshi Ema, Kanagawa, JP;
Inventors:
Nobunari Tsukamoto, Kanagawa, JP;
Hidetoshi Ema, Kanagawa, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A multiphase delay unit causes different delay times to a reference clock to generate a multiphase clock with different phases. A multiphase sampling unit samples the input signal using the multiphase clock, and outputs multiphase sampling data. A phase selecting unit detects a phase relation of the multiphase clock using the multiphase sampling data, and selects output data from the multiphase sampling data based on a result of detecting the phase relation.