The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Jan. 31, 2003
Dennis L. Wilson, Palo Alto, CA (US);
Brian Kidder, Fremont, CA (US);
Tahmineh Kazemi, Saratoga, CA (US);
Dennis L. Wilson, Palo Alto, CA (US);
Brian Kidder, Fremont, CA (US);
Tahmineh Kazemi, Saratoga, CA (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
Systems and methods that measure the delay (latency) through a digital processor or circuit. A waveform generator outputs a primary (chirp) signal to the digital circuit, along with an auxiliary pulse signal to a delay circuit. The auxiliary signal corresponds to a sample of the primary signal that is input to and output from the digital circuit. A clock circuit provides input and output clock signals to the digital circuit and delay circuit. Clocked outputs of the digital circuit and delay circuit are input to an analyzer. The time delay between the auxiliary signals and delayed auxiliary signals are measured by a time measurement circuit. The analyzer processes the outputs of the processor and delay circuit and the time delay (reference time) using an analysis routine to determine the latency of the digital circuit. The analyzer collects data containing primary signals during a data collection time period, and determines the latency of the digital circuit by adding the data collection time to the reference time and subtracting the time between the start of data collection and the delayed auxiliary signal.