The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Apr. 03, 2009
Applicants:
Seung-youl Jeong, Hwaseong-si, KR;
Se-hyun Kim, Suwon-si, KR;
Jae-deog Cho, Suwon-si, KR;
Inventors:
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided are a disk defect inspection method and apparatus. The defect inspection method includes; determining an independent recording density value for disk defect detection in relation to disk drive component factors excepting a disk of the disk drive, and performing a disk defect inspection using the independent recording density value for disk defect detection.