The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
May. 25, 2010
Mai A. Ghaly, Bloomington, MN (US);
James E. Angelo, Savage, MN (US);
Akhila Tadinada, Bloomington, MN (US);
Paul J. Choquette, Glendale, RI (US);
Kenneth R. Burns, Cannon Falls, MN (US);
Kevin M. Bailey, Belle Plaine, MN (US);
Mai A. Ghaly, Bloomington, MN (US);
James E. Angelo, Savage, MN (US);
Akhila Tadinada, Bloomington, MN (US);
Paul J. Choquette, Glendale, RI (US);
Kenneth R. Burns, Cannon Falls, MN (US);
Kevin M. Bailey, Belle Plaine, MN (US);
Seagate Technology LLC, Cupertino, CA (US);
Abstract
A method is provided that decides whether a region of data storage units in a data storage system should be scanned for defective data. A current region of data storage units affected by a write operation is determined and which select transducing head of the data storage system that corresponds with the current region is also determined. A scalar value that corresponds with the select transducing head is retrieved. The scalar value related to a condition of the select transducing head based on previously conducted performance tests. An incremented write count of the affected region is scaled by the scalar value to obtain a new increment write count. A defective data scan is performed on the affected region if the new increment write count exceeds a default write count threshold.