The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Apr. 17, 2008
Mototaka Kanaya, Sano, JP;
Shuji Akiya, Saitama, JP;
Mototaka Kanaya, Sano, JP;
Shuji Akiya, Saitama, JP;
Fujinon Corporation, Saitama-shi, JP;
Abstract
Two types of layers are simultaneously formed on a substrate and another substrate under the same layer forming condition, the heights of which are equal to a half height of an intended retardation compensation layer. Physical properties of the respective two types of layers formed on the substrates are identical to each other, and if deviations are produced in retardation distribution characteristics for azimuth angles of incident light, these deviations are commonly provided in the respective two types of layers. When one substrate is superposed with the other substrate and these superposed substrates are integrated with each other in order to make a single sheet of retardation compensation element, after one of these substrates is rotated by an angle of 90 degrees with respect to the other substrate, these substrates are stuck to each other by an adhesive agent.