The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Sep. 30, 2010
Junta Yamamichi, Yokohama, JP;
Miki Ogawa, Machida, JP;
Yoichiro Handa, Yokohama, JP;
Takeshi Imamura, Chigasaki, JP;
Norihiko Utsunomiya, Machida, JP;
Satoru Nishiuma, Kawasaki, JP;
Junta Yamamichi, Yokohama, JP;
Miki Ogawa, Machida, JP;
Yoichiro Handa, Yokohama, JP;
Takeshi Imamura, Chigasaki, JP;
Norihiko Utsunomiya, Machida, JP;
Satoru Nishiuma, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A detection device comprising a substrate comprising a plurality of objects of which properties are changed due to the contact with a target substance, means for bringing the target substance into contact with the objects, and means for detecting a change in properties of the objects caused when the target substance is brought into contact with the objects, based on light output when the objects are irradiated with light, wherein the plurality of the objects are located in the direction in which the light for irradiation travels, and the detecting means is means for detecting the change in the properties based on the summation of light output from the plurality of the objects upon irradiation with light.