The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2011

Filed:

Jul. 31, 2007
Applicants:

Ming C. Hao, Palo Alto, CA (US);

Umeshwar Dayal, Saratoga, CA (US);

Daniel A. Keim, Stasslingen, DE;

Dominik Morent, Constance, DE;

Inventors:

Ming C. Hao, Palo Alto, CA (US);

Umeshwar Dayal, Saratoga, CA (US);

Daniel A. Keim, Stasslingen, DE;

Dominik Morent, Constance, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

To visualize and analyze data, selection of at least one focus area in a visualization of a data set is received. Based on characteristics of the selected at least one focus area, using at least one analytic technique to mine relationships between data items and at least one attribute in the selected at least one focus area and data items and at least one attribute in remaining portions of the data set. At least one visual representation is generated to show mining results produced from selected data items and one or more attributes in the selected at least one focus area and the remaining portions of the data set, where the generated visual representation is composed to have an order and layout to represent the mined results.


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