The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8022869 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 20, 2011

Filed:

May. 29, 2008
Applicants:

Jie Wu, San Diego, CA (US);

Rizwan Ahmed, Alexandria, VA (US);

Emilija M. Simic, La Jolla, CA (US);

Dominic Gerard Farmer, Los Gatos, CA (US);

Inventors:

Jie Wu, San Diego, CA (US);

Rizwan Ahmed, Alexandria, VA (US);

Emilija M. Simic, La Jolla, CA (US);

Dominic Gerard Farmer, Los Gatos, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 19/24 (2010.01); G01S 19/37 (2010.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for cross-correlation spur mitigation comprising choosing from a plurality of peak measurements, a first peak measurement with a first carrier-to-noise density estimate and a first Doppler offset measurement, and a second peak measurement with a second carrier-to-noise density estimate and a second Doppler offset measurement to form a pair; calculating a carrier-to-noise density difference based on the first carrier-to-noise density estimate and the second carrier-to-noise density estimate; calculating a Doppler difference based on the first Doppler offset measurement and the second Doppler offset measurement; comparing the carrier-to-noise density difference to a carrier-to-noise density threshold; and comparing the Doppler difference to at least one Doppler threshold.


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