The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2011

Filed:

Sep. 21, 2007
Applicants:

Young-bae Jung, Daejon, KR;

Soon-ik Jeon, Daejon, KR;

Chang-joo Kim, Daejon, KR;

Inventors:

Young-Bae Jung, Daejon, KR;

Soon-Ik Jeon, Daejon, KR;

Chang-Joo Kim, Daejon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided to a method for measuring antenna characteristics operating in an out-of-operational frequency range of a chamber, in the chamber having a predetermined operational frequency range, including the steps of: a) measuring reflected wave characteristics of the out-of-operational frequency range generated within the chamber; b) measuring the characteristics of a measurement target antenna operating in the out-of-operational frequency range of the chamber; and c) measuring final characteristics of the measurement target antenna by compensating the characteristic data of the measurement target antenna measured in the step b) for reflected wave data measured in the step a).


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