The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Dec. 17, 2008
Method and apparatus for simultaneously acquiring multiple slices/slabs in magnetic resonance system
Jyh-horng Chen, Taipei, TW;
Tzi-dar Chiueh, Taipei, TW;
Edzer L. Wu, Taipei, TW;
Li-wei Kuo, Taipei, TW;
Jyh-Horng Chen, Taipei, TW;
Tzi-Dar Chiueh, Taipei, TW;
Edzer L. Wu, Taipei, TW;
Li-Wei Kuo, Taipei, TW;
National Taiwan University, Taipei, TW;
Abstract
Provided is a method for simultaneously acquiring magnetic resonance slices/slabs of a subject. The method comprises steps as follows. First, apply one or more than one RF pulse, which carries at least two frequency components, and a slice/slab selection magnetic field gradient so that at least two slices/slabs of the subject respectively corresponding to the at least two frequency components are excited simultaneously. Second, apply a spatial encoding magnetic field gradient. Third, apply a slice/slab separation magnetic field gradient so as to separate the at least two slices/slabs. The method according to the present invention can be used to acquire data for simultaneously reconstructing multiple slices/slabs. The method is compatible with existing MRI systems.