The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2011

Filed:

Apr. 26, 2005
Applicants:

Masashi Tsuboi, Yokosuka, JP;

Tsutomu Horikoshi, Kamakura, JP;

Inventors:

Masashi Tsuboi, Yokosuka, JP;

Tsutomu Horikoshi, Kamakura, JP;

Assignee:

NTT DoCoMo, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical wavefront control pattern generating apparatus () relating to the present invention includes: a target image detector unit () configured to detect spatial information of the object (B) as a target image; a reconstructed image detector unit () configured to detect the reconstructed image displayed on the reconstructed image display unit (); and an optimizer unit () configured to evaluate, on the basis of the target image detected by the target image detector unit (), the reconstructed image detected by the reconstructed image detector unit (), and to apply a modification process to the optical wavefront control pattern in a way that a result of the evaluation satisfies a predetermined condition, so as to generate the optimum optical wavefront control pattern.


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