The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2011

Filed:

May. 29, 2009
Applicants:

Byungwoo Lee, Rexford, NY (US);

Yanyan Wu, Houston, TX (US);

Nicholas Joseph Kray, Blue Ash, OH (US);

Inventors:

Byungwoo Lee, Rexford, NY (US);

Yanyan Wu, Houston, TX (US);

Nicholas Joseph Kray, Blue Ash, OH (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01D 5/28 (2006.01); G01B 5/012 (2006.01); G01B 7/012 (2006.01);
U.S. Cl.
CPC ...
Abstract

An inspection system comprises a sensor configured to acquire inspection data of the object, a motion control device, a joint assembly coupled to the motion control device, and a probe housing coupled to the joint assembly and configured to hold the sensor. The inspection system further comprises a compliant element coupled to the probe housing and configured to cooperate with the joint assembly and the motion control device to position the sensor relative to the object. A self-aligning probe assembly is also presented.


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