The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2011
Filed:
Oct. 13, 2005
Mitsuo Eguchi, Saitama, JP;
Tetsuhiko Yoshida, Nagoya, JP;
Mitsuo Eguchi, Saitama, JP;
Tetsuhiko Yoshida, Nagoya, JP;
Lightron Co., Ltd., Saitama-shi, JP;
Lightron International Co., Ltd., Saitama-shi, JP;
Abstract
The present invention provides a technology which can perform a precise restoration to a distribution of original information by carrying out an iterative calculation using only a distribution of degraded information. The method according to the present invention performs the restoration to original information based only on degraded information. The method according to the present invention considers the distribution of the degraded information and the distribution of the original information as distributions of probability density functions, and considers a transfer function of a transfer system as a probability density function of a conditional probability. The most probable estimations of the distribution of the original information with respect to the distribution of the degraded information and the most probable estimations of the distribution of the transfer function are alternately carried out to finally restore the original information by means of the iterative calculation based on the Bayes' theorem for probability density functions.