The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2011

Filed:

Mar. 07, 2005
Applicants:

Hongyue Dai, Kenmore, WA (US);

Laura J. Van't Veer, Amsterdam, NL;

John Lamb, Shoreline, WA (US);

Roland Stoughton, San Diego, CA (US);

Stephen H. Friend, Philadelphia, PA (US);

Yudong He, Kirkland, WA (US);

Inventors:

Hongyue Dai, Kenmore, WA (US);

Laura J. Van't Veer, Amsterdam, NL;

John Lamb, Shoreline, WA (US);

Roland Stoughton, San Diego, CA (US);

Stephen H. Friend, Philadelphia, PA (US);

Yudong He, Kirkland, WA (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides prognostic methods for conditions such as cancer, for example, breast cancer, comprising classifying an individual by a plurality of phenotypic, genotypic or clinical characteristics of the condition into a plurality of patient subsets, and analyzing the pattern of expression of prognosis-informative genes identified for that subset in a sample from the individual. The present invention also provides methods for constructing such patient subsets and of identifying prognosis-informative genesets for such subsets. The invention further provides methods of assigning a therapeutic regimen to an individual, microarrays useful for performing prognosis, kits comprising these microarrays, and computer systems and programs for implementing the methods of the invention.


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