The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2011
Filed:
Feb. 23, 2007
Todd Jochem, Wexford, PA (US);
Parag Batavia, Wexford, PA (US);
Mark Ollis, Cranberry Township, PA (US);
Todd Jochem, Wexford, PA (US);
Parag Batavia, Wexford, PA (US);
Mark Ollis, Cranberry Township, PA (US);
Applied Perception Inc., Wexford, PA (US);
Abstract
A system and method of identifying a position of a crop row in a field, where an image of two or more crop rows is transmitted to a vision data processor. A preferential scan line profile in a search space about a candidate scan line profile is determined, and the candidate scan line profile is identified as a preferential scan line profile for estimating a position (e.g., peak variation) of one or more crop rows if a variation in the intensity level of the candidate scan line profile exceeds a threshold variation value. Alternatively, a position datum associated with a highest intensity value within the array of vector quantities can be selected as being indicative of a candidate position of a crop row. The candidate position is then identified as a preliminary row position if a variation in intensity level of the candidate scan line profile exceeds a threshold variation value.