The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2011

Filed:

Jun. 09, 2009
Applicant:

Tadashi Sasakawa, Tokyo, JP;

Inventor:

Tadashi Sasakawa, Tokyo, JP;

Assignee:

Pasco Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method and apparatus for evaluating a solar radiation amount that can realize higher accuracy by virtue of consideration of terrain conditions. Static satellite image dataand three-dimensional map modelare combined, and a meshbased on plane coordinates is set in accordance with a ground resolution of the static satellite image data. A shadow areais calculated based on the three-dimensional map modeland a solar position specified by photographing chronological data, and whether or not each cellof the meshbelongs to the shadow areais determined. Also, a solar radiation evaluation componentof each cellin an area to be evaluated is obtained with reference to a tableassociating a pixel valueof each pixel in the static satellite image datawith the solar radiation evaluation componentin an area corresponding to each pixel. In addition, when the cellis determined to belong to the shadow area, an evaluation component after terrain condition correction calculated by applying a predetermined correction calculation to the solar radiation evaluation componentis obtained.


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