The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8019028 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 13, 2011

Filed:

Mar. 26, 2008
Applicants:

Anthony Eugene Zortea, Pipersville, PA (US);

Matthew Mcadam, Vancouver, CA;

Inventors:

Anthony Eugene Zortea, Pipersville, PA (US);

Matthew McAdam, Vancouver, CA;

Assignee:

PMC-Sierra, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus and methods determine a frequency associated with a relatively strong interfering signal (interferer) using relatively simple run-length counting techniques. Counts of run-lengths can be analyzed to estimate a frequency of the interferer. For example, a peak run-length can be associated with a frequency. In one embodiment, counts of run-lengths are used to construct a theoretical peak run-length, which is then associated with a frequency for the interferer. A theoretical count associated with the theoretical peak run-length can also be used as an indication of a signal strength of the interferer.


Find Patent Forward Citations

Zortea, Anthony. (2011). Run-length based spectral analysis (U.S. Patent No. 8019028). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8019028

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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