The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2011
Filed:
Feb. 07, 2008
Kyeongho Lee, Seoul, KR;
Joonbae Park, Seoul, KR;
Jeong Woo Lee, Seoul, KR;
Seung-wook Lee, Seoul, KR;
Eal Wan Lee, Seoul, KR;
Kyeongho Lee, Seoul, KR;
Joonbae Park, Seoul, KR;
Jeong Woo Lee, Seoul, KR;
Seung-Wook Lee, Seoul, KR;
Eal Wan Lee, Seoul, KR;
GCT Semiconductor, Inc., San Jose, CA (US);
Abstract
The present general inventive concept relates to apparatuses and/or methods for measuring an in-phase and quadrature (IQ) imbalance. In one embodiment, a detector can measure an error caused by an IQ imbalance using a first IQ signal including a desired signal and a corresponding image signal by the IQ imbalance. The detector can include a derotator to derotate the first IQ signal by a first angular frequency to obtain a second IQ signal and derotate the first IQ signal by a second angular frequency to obtain a third IQ signal, a DC estimator to obtain a fourth IQ signal corresponding to a DC component of the second IQ signal and a fifth IQ signal corresponding to a DC component of the third IQ signal and a controller can determine a gain error or a phase error from the fourth IQ signal and the fifth IQ signal.