The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2011

Filed:

Oct. 30, 2009
Applicants:

Naoki Yamagata, Tokyo, JP;

Shuichi Takeuchi, Saitama, JP;

Inventors:

Naoki Yamagata, Tokyo, JP;

Shuichi Takeuchi, Saitama, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/135 (2006.01);
U.S. Cl.
CPC ...
Abstract

A resin objective lens having a numerical aperture NA≧0.75. The objective lens satisfies a condition:0≦|SC|<0.002 where f denotes a focal length at a wavelength λ and |SC|denotes a maximum absolute value of an offence against a sine condition in a range larger than or equal to 0% and smaller than 90% of an effective beam radius with respect to an optical axis. The objective lens is configured such that the offence against the sine condition at a 100% point of the effective beam radius is smaller than that defined at a 90% point. At least a light source side surface of the objective lens is formed to be an aspherical surface, and the objective lens satisfies a condition:1.40<(−1)·(SAG1)'·/NA<1.95 where (SAG1)′represents a maximum gradient of the light source side surface within an effective beam diameter.


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