The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2011
Filed:
Mar. 09, 2010
Seiichiro Tabata, Sanda, JP;
Seiichiro Tabata, Sanda, JP;
Sysmex Corporation, Kobe, JP;
Abstract
A compact optical system for a particle analyzer and particle analyzer using same are provided. The optical system for a particle analyzer of the present invention comprises a light source, an irradiation optical system for irradiating particles passing through a flow cell with light from the light source, a photodetector for receiving the scattered light from the particles, a light shielding member for blocking the direct light from the light source from impinging the photodetector, and a detecting lens for directing the scattered light toward the photodetector, wherein the irradiation optical system forms a first focus that focuses the light from the light source on the particle passing through the flow cell, and forms a second focus that focuses the light from the light source at a position between the detecting lens and photodetector, and disposes the light shielding member at the position of the second focus.