The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2011

Filed:

Dec. 15, 2004
Applicant:

Kimiaki Toshikiyo, Osaka, JP;

Inventor:

Kimiaki Toshikiyo, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); G02B 5/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an optical device and the like which can collect incident light at a high incident angle than an existing microlens, in order to realize a solid-state imaging apparatus and the like corresponding to an optical system (an optical system with a high incident angle θ) with a short focal length for a thin camera. Each unit pixel (2.8 μm square in size) is made up of a distributed index lens, a color filterfor green G, Al wirings, a signal transmitting unit, planarizing films, a light-receiving device (Si photodiodes), and a Si substrate. The distributed index lensis made of high refractive index materials[TiO(n=2.53)] and low refractive index materials[air (n=1.0)] having concentric zones. Further, in a distributed refractive index lens, a widthof adjacent divided areas is 200 nm. Also, a film thickness t is 0.5 μm.


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