The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2011
Filed:
Oct. 23, 2008
Applicants:
Wendy Wang, Shanghai, CN;
Zhenhong Sun, Shanghai, CN;
Tao Pan, Shanghai, CN;
Xuanbin Liu, Shanghai, CN;
Inventors:
Wendy Wang, Shanghai, CN;
Zhenhong Sun, Shanghai, CN;
Tao Pan, Shanghai, CN;
Xuanbin Liu, Shanghai, CN;
Assignee:
Honeywell International Inc., Morristown, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for real-time, simultaneous, quantitative measurement for detecting a single nucleotide polymorphism in a target nucleic acid is provided. This method involves combining a polymerase chain reaction (PCR) technique with invader assay technique.