The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2011

Filed:

Oct. 13, 2010
Applicants:

Takuya Nakazono, Osaka, JP;

Seiji Umemoto, Osaka, JP;

Fumihito Shimanoe, Osaka, JP;

Inventors:

Takuya Nakazono, Osaka, JP;

Seiji Umemoto, Osaka, JP;

Fumihito Shimanoe, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 41/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An information storage-readout-calculation system for use in a continuous manufacturing system of liquid-crystal display elements, comprising information storage medium for storing information of defects detected through a preliminary inspection of a continuous polarizing composite film included in a continuous optical film laminate, a roll of a continuous inspected optical film laminate being provided with identification means and a slitting position calculation means for determining defective-polarizing-sheet slitting positions to define defect-containing polarizing sheets having defects and normal-polarizing-sheet slitting positions to define defect-free polarizing sheets by using defect position information read out from the information storage medium based on the identification means, an, a method for manufacturing the information storage-readout-calculation system.


Find Patent Forward Citations

Loading…