The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2011
Filed:
Dec. 17, 2007
Applicants:
Noriji Kawai, Gamagori, JP;
Tetsuyuki Miwa, Nukata-gun, JP;
Kunihiko Otake, Gamagori, JP;
Inventors:
Assignee:
Nidek Co., Ltd., Gamagori-Shi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
An eye axial length measurement apparatus includes a light source, a non-contact eye axial length measurement unit for optically measuring axial length of a patient's eye in non-contact manner, an XYZ driving unit, and a determination means which determines whether a cloudy portion which is an obstacle to measurement by the non-contact eye axial length measurement unit is present, based on one of a measurement result of the non-contact eye axial length measurement unit and an imaging result of an anterior segment section imaging unit placeable in the non-contact eye axial length measurement unit.