The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2011

Filed:

Dec. 15, 2010
Applicants:

Brian W. Carr, Nevada, IA (US);

Scott A. Sporrer, Nevada, IA (US);

Curtis R. Hammer, Nevada, IA (US);

Scott P. Lyle, Urbandale, IA (US);

Cory W. Fees, Urbandale, IA (US);

Adam R. Koesters, Ames, IA (US);

Inventors:

Brian W. Carr, Nevada, IA (US);

Scott A. Sporrer, Nevada, IA (US);

Curtis R. Hammer, Nevada, IA (US);

Scott P. Lyle, Urbandale, IA (US);

Cory W. Fees, Urbandale, IA (US);

Adam R. Koesters, Ames, IA (US);

Assignee:

Gary W. Clem, Inc., Nevada, IA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A flow meter used in relation to a hopper mounted to a frame and a transfer tube connected to an in communication with the hopper. Both the hopper and the transfer tube have gates that are connected to actuators for selectively opening and closing the gates. A sensor is mounted to the frame adjacent the transfer tube. Mounted below and in communication with the transfer tube is the flow meter. The flow meter has a curved chute and a load beam that measure the inertial force of material acting upon the curved chute over time.


Find Patent Forward Citations

Carr, Brian. (2011). Method and means of measuring the flow rate of particulate matter (U.S. Patent No. 8015884). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8015884

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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