The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2011

Filed:

Dec. 08, 2010
Applicant:

Yoshinori Matsuyama, Aichi, JP;

Inventor:

Yoshinori Matsuyama, Aichi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for measuring a shape of an eyeglass frame, includes: a tracing stylus moving unit that includes a tracing stylus detecting a position of a rim of the frame in a moving radius direction and in a vertical direction, a tracing stylus shaft for the tracing stylus, a holding unit configured to vertically-movably hold the tracing stylus shaft, a vertical direction moving unit for moving the holding unit in the vertical direction, and a moving radius direction moving unit for moving the holding unit in the moving radius direction so that the tracing stylus traces the rim; a vertical position detection unit for detecting a position of the tracing stylus in the vertical direction; and a controller for obtaining a next measurement position of the holding unit in the vertical direction based on the detecting result of the vertical position detection unit, and controls the vertical direction moving unit.


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