The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2011

Filed:

May. 07, 2008
Applicants:

Yoshiyuki Nakamura, Kanagawa, JP;

Toshiharu Asaka, Kanagawa, JP;

Toshiyuki Maeda, Kanagawa, JP;

Tomonori Sasaki, Kanagawa, JP;

Inventors:

Yoshiyuki Nakamura, Kanagawa, JP;

Toshiharu Asaka, Kanagawa, JP;

Toshiyuki Maeda, Kanagawa, JP;

Tomonori Sasaki, Kanagawa, JP;

Assignee:

Renesas Electronics Corporation, Kawasaki-shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test circuit including a TAP controller specified in IEEE (Institute of Electrical and Electronics Engineers) 1149 and a test access port includes a first controller including a selecting circuit and a first TAP controller, the selecting circuit generating an internal TMS signal in accordance with TMS signal and selecting an output destination of the internal TMS signal in accordance with a selection signal, and the first TAP controller changing internal state based on the internal TMS signal, testing corresponding test target block in accordance with instruction code for test, and generating the selection signal in accordance with instruction code for selection, and a second controller including a second TAP controller changing internal state based on the internal TMS signal and testing corresponding test target block in accordance with the instruction code for test.


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