The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2011

Filed:

Jan. 15, 2009
Applicants:

Rajendra Inamdar, N. Chelmsford, MA (US);

Franklin Simpson, Ipswich, NH (US);

Sandeep Shrivastava, Westford, MA (US);

Michael Cico, Hampton, NH (US);

Richard P. Mousseau, Stratham, NH (US);

Inventors:

Rajendra Inamdar, N. Chelmsford, MA (US);

Franklin Simpson, Ipswich, NH (US);

Sandeep Shrivastava, Westford, MA (US);

Michael Cico, Hampton, NH (US);

Richard P. Mousseau, Stratham, NH (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for synthesizing custom metric attributes from available attributes. The system includes an application server that exposes available metric attributes of a MBean. A network console displays for selection the metric attributes of the MBean on a navigation tree and a view panel is located on the network management console where the metric attributes are dragged. The console and view panel allow network administrators to review monitoring data collected exposed by the application server. Custom attributes are created by combining attributes made available by the application server and can be combined to synthesize a custom expression that can be made available to other managed servers on the application server.


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