The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2011

Filed:

Oct. 19, 2004
Applicants:

Anoop Sharma, Union City, CA (US);

Makarand Kulkarni, Sunnyvale, CA (US);

I-chin Chen, San Jose, CA (US);

Nadir Hussain, Palo Alto, CA (US);

Corey Innis, San Francisco, CA (US);

Inventors:

Anoop Sharma, Union City, CA (US);

Makarand Kulkarni, Sunnyvale, CA (US);

I-Chin Chen, San Jose, CA (US);

Nadir Hussain, Palo Alto, CA (US);

Corey Innis, San Francisco, CA (US);

Assignee:

eBay Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system to reduce false positives within an automated software-testing environment using a comparator module, a filter application module, and a preview generator module is provided. In one exemplary embodiment, a method within a testing system for testing web pages associated with a current version website by automatically generating filter data by comparing differences between a plurality of iterations of a test case executed on a previous version website, automatically generating error data by executing the test case on the current version website, and detecting differences between the previous version and the current version of the website by applying filtering rules within the filter data to the error data to remove false positives.


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