The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2011

Filed:

Dec. 21, 2004
Applicant:

Lars Richard Birger Hellberg, Huddinge, SE;

Inventor:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A non-linear processing device () is presented, in which fractional-delay filtering ()—fractional as compared with a sample rate used in the processing steps—is used between successive processing steps (). A corresponding method is also presented. The fractional delay () exposes the signal in-between the original samples to the non-linear processing (). A lower sample rate or a higher signal quality can thus be achieved. The so-called fractional sample delays are preferably chosen differently for different systems depending on bandwidths, number of channels, number of non-linear processing steps () and other varying factors. The multi-step non-linear processing () concept of the invention is preferably used within a cascade of non-linear modifications and/or filtering steps ().


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