The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2011

Filed:

Jul. 08, 2010
Applicants:

Neal T. Fachan, Seattle, WA (US);

Peter J. Godman, Seattle, WA (US);

Justin M. Husted, Seattle, WA (US);

Aaron J. Passey, Seattle, WA (US);

Inventors:

Neal T. Fachan, Seattle, WA (US);

Peter J. Godman, Seattle, WA (US);

Justin M. Husted, Seattle, WA (US);

Aaron J. Passey, Seattle, WA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the invention relate generally to incremental computing. Specifically, embodiments of the invention include systems and methods that provide for the concurrent processing of multiple, incremental changes to a data value while at the same time monitoring and/or enforcing threshold values for that data value. For example, a method is provided that determines whether multiple incremental changes to a data field could pass a threshold based on keeping track of a possible value range for the data field.


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