The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2011
Filed:
Jul. 19, 2004
Ken L. Cheung, Livingston, NJ (US);
Chen-huan Chiang, Princeton Junction, NJ (US);
Kenneth Y. Ho, Ledgewood, NJ (US);
John A. Andersen, Oakland, NJ (US);
Bradford G. Van Treuren, Lambertville, NJ (US);
Robert W. Barr, Yardley, PA (US);
Victor J. Velasco, Princeton, NJ (US);
Dante DE Rogatis, West Caldwell, NJ (US);
Ken L. Cheung, Livingston, NJ (US);
Chen-Huan Chiang, Princeton Junction, NJ (US);
Kenneth Y. Ho, Ledgewood, NJ (US);
John A. Andersen, Oakland, NJ (US);
Bradford G. Van Treuren, Lambertville, NJ (US);
Robert W. Barr, Yardley, PA (US);
Victor J. Velasco, Princeton, NJ (US);
Dante De Rogatis, West Caldwell, NJ (US);
Alcatel Lucent, Paris, FR;
Abstract
A distributed test architecture of transmitting boundary scan Test Access Port (TAP_signals over a serial channel is disclosed. The architecture facilitates the system testing and remote field update of distributed base stations in a wireless network. The distributed test architecture enables system testing as if the distributed units are on a backplane within the same chassis by creating a plurality of logical connections between the distributed unit and the test bus using a single bit fiber line and a five bit TAP test bus.