The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2011

Filed:

Oct. 26, 2006
Applicant:

Takuya Chiba, Tokyo, JP;

Inventor:

Takuya Chiba, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing device to correct chromatic aberration of image data is provided. The image processing device includes an overexposed pixel detecting unit configured to detect overexposed pixels by using a luminance signal of the image data; an overexposure distribution information generating unit configured to generate overexposure distribution information indicating distribution of the overexposed pixels detected by the overexposed pixel detecting unit; and a chromatic aberration amount calculating unit configured to calculate the amount of chromatic aberration of each pixel by using the overexposure distribution information generated by the overexposure distribution information generating unit and chromatic aberration amount distribution information indicating distribution of the amount of chromatic aberration, which is the amount of correction regarding chromatic aberration of nearby pixels due to overexposure of a target pixel.


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