The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2011
Filed:
Aug. 13, 2008
Danlu Zhang, San Diego, CA (US);
Naga Bhushan, San Diego, CA (US);
Rajesh Kumar Pankaj, San Diego, CA (US);
Danlu Zhang, San Diego, CA (US);
Naga Bhushan, San Diego, CA (US);
Rajesh Kumar Pankaj, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Techniques for performing admission control based on quality-of-service (QoS) performance in a wireless communication network are described. QoS performance (e.g., delay or throughput performance) of admitted data flows may be determined. Whether to admit or reject a new data flow may then be determined based on the QoS performance of the admitted data flows. The admitted and new data flows may have delay bounds. The QoS performance of the admitted data flows may be given by a measured sector delay, which may be determined based on actual delays of packets. A measured flow delay for each admitted data flow may be determined based on delays of packets for that flow. The measured sector delay may then be determined based on the measured flow delays for all admitted data flows. The new data flow may be admitted if the measured sector delay is less than a delay threshold.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile