The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2011
Filed:
Mar. 06, 2008
Applicants:
Jeffrey W. Scott, Carpinteria, CA (US);
Gene R. Loefer, Orlando, FL (US);
Nicholas J. Pfister, Buellton, CA (US);
Inventors:
Jeffrey W. Scott, Carpinteria, CA (US);
Gene R. Loefer, Orlando, FL (US);
Nicholas J. Pfister, Buellton, CA (US);
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/20 (2006.01); G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates generally to a method and apparatus for attaching a close proximity filter to an FPA (focal plane array) and more particularly, to a method and apparatus that allows improved spectral discrimination of a mid-wave infra red (MWIR) detector by applying an improved multi-color filter to a focal plane array (FPA), while employing existing production equipment and techniques to reduce cost and improve production yield.