The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2011
Filed:
Apr. 01, 2009
Shyam P. Keshavmurthy, Ann Arbor, MI (US);
Chengchih Lin, Ann Arbor, MI (US);
Alfred A. Pease, Ann Arbor, MI (US);
Richard A. Krakowski, Troy, MI (US);
Shyam P. Keshavmurthy, Ann Arbor, MI (US);
Chengchih Lin, Ann Arbor, MI (US);
Alfred A. Pease, Ann Arbor, MI (US);
Richard A. Krakowski, Troy, MI (US);
Perceptron, Inc., Plymouth, MI (US);
Abstract
A structured light sensor system for measuring contour of a surface includes an imaging lens system, an image capturing device, a first set of micro electromechanical system (MEMS) mirrors, and a control module. The imaging lens system focuses light reflected from the surface, wherein the imaging lens system has a corresponding lens plane. The image capturing device captures the focused light and generates data corresponding to the captured light, wherein the image capturing device has a corresponding image plane that is not parallel to the lens plane. The first set of MEMS mirrors direct the focused light to the image capturing device. The control module receives the data, determines a quality of focus of the captured light based on the received data, and controls the first set of MEMS mirrors based on the quality of focus to maintain a Scheimpflug tilt condition between the lens plane and the image plane.