The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2011

Filed:

Oct. 04, 2007
Applicants:

Makoto Imai, Kanagawa, JP;

Hiroshi Nishizawa, Kanagawa, JP;

Inventors:

Makoto Imai, Kanagawa, JP;

Hiroshi Nishizawa, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/0232 (2006.01); H01L 31/0203 (2006.01); H01L 21/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging device includes a lens (), an optical filter (), a semiconductor imaging element () having a light receiving section, and a tridimensional substrate () on which the semiconductor imaging element () and the optical filter () are mounted, wherein the tridimensional substrate () has an opening () corresponding to the light receiving section of the semiconductor imaging element (), the semiconductor imaging element () and the optical filter () are located on one side of the opening (), the lens () is located on the other side of the opening (), and the semiconductor imaging element () and the optical filter () are fixed to the tridimensional substrate () under the condition that the semiconductor imaging element () and the optical filter () are curved, and have respective centers moved in a direction away from the lens ().


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