The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8012755 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 06, 2011

Filed:

Aug. 17, 2007
Applicants:

Takeo Fukui, Tokyo, JP;

Ikunori Yokoi, Tokyo, JP;

Tetsuo Mizuniwa, Tokyo, JP;

Inventors:

Takeo Fukui, Tokyo, JP;

Ikunori Yokoi, Tokyo, JP;

Tetsuo Mizuniwa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/18 (2006.01); G01N 33/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A water quality evaluation method capable of evaluating quality of water to be evaluated with high precision and a substrate contacting apparatus used in the water quality evaluation method are provided. The substrate contacting apparatushas a sealing performance keeping the interior at a vacuum degree lower than or equal to −0.094 MPa. A substrate W is accommodated in the substrate contacting apparatusand water to be evaluated is fed therein, after stopping feeding water, the interior of the substrate contacting apparatusis sealed, and the substrate contacting apparatusis sent to an analysis device with the substrate W accommodated therein.


Find Patent Forward Citations

Fukui, Takeo. (2011). Water quality evaluation method and substrate contacting apparatus used (U.S. Patent No. 8012755). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8012755

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