The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8012231 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 06, 2011

Filed:

Jun. 26, 2007
Applicants:

Katsumi Saitoh, Kyoto, JP;

Junji Kato, Kyoto, JP;

Masahiko Fujiwara, Kyoto, JP;

Masayoshi Shinohara, Kyoto, JP;

Inventors:

Katsumi Saitoh, Kyoto, JP;

Junji Kato, Kyoto, JP;

Masahiko Fujiwara, Kyoto, JP;

Masayoshi Shinohara, Kyoto, JP;

Assignee:

Horiba, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 59/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A particulate collection system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass measuring unit and composition analyzing unit can be provided for either simultaneous or immediately consecutive measurements within a single instrument. The filter material can have an antistatic electricity characteristic and can be impregnated with reference material to enable calibration of the composition analyzing unit.


Find Patent Forward Citations

Saitoh, Katsumi. (2011). Particulate matter analyzer, collecting filter and system for analyzing and collecting samples from fluids (U.S. Patent No. 8012231). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8012231

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