The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2011
Filed:
Jul. 29, 2008
Austen Hearn, Reading, GB;
Simon Meadowcroft, Stowmarket, GB;
Richard Holley, Maidenhead, GB;
Lein Applied Diagnostics, Berkshire, GB;
Abstract
An optical measurement apparatus comprises an optical system. The optical system comprises a source and an image capture device. The source is arranged to generate, when in use, a beam of electromagnetic radiation. Further, the optical system is arranged to direct the beam of electromagnetic radiation to a location to be measured. The optical measurement apparatus also comprises a feedback arrangement arranged to receive a reflected beam from the location to be measured and to provide feedback information in response to receipt of the reflected beam, the feedback information being indicative of degree of alignment of the location to be measured with the optical system.