The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Dec. 29, 2008
Henry W. Trombley, Starksboro, VT (US);
Josef S. Watts, South Burlington, VT (US);
Henry W. Trombley, Starksboro, VT (US);
Josef S. Watts, South Burlington, VT (US);
International Business Machine Corporation, Armonk, NY (US);
Abstract
A method, apparatus and program product are provided for extracting parameters for compact models for semiconductor devices. A first set of parameters associated with first and second semiconductor devices is defined and has the same value for all devices. A second set of parameters associated with the semiconductor devices is defined having values that differ among the devices. Data is measured from the semiconductor devices related to the first and second set of parameters. A mathematical relationship is established between the measured data, and the values of the second set of parameters are adjusted to fit the established mathematical relationship. The mathematical relationship may also be a correlation of the measured data from the first semiconductor device with the measured data from the second semiconductor device creating a data set for parameter extraction. Parameters may then be extracted from the data set related to the first and second semiconductor devices.