The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Apr. 06, 2009
Byron Birkedahl, Glendale, AZ (US);
Nicholas Wilt, Glendale, AZ (US);
Art Mccready, Glendale, AZ (US);
Brendan Hall, Eden Prairie, MN (US);
Aaron Larson, Shoreview, MN (US);
Byron Birkedahl, Glendale, AZ (US);
Nicholas Wilt, Glendale, AZ (US);
Art McCready, Glendale, AZ (US);
Brendan Hall, Eden Prairie, MN (US);
Aaron Larson, Shoreview, MN (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
Methods and systems for a scalable self-checking processing platform are described herein. According to one embodiment, during an execution frame, a first processing element executes both a high-criticality application and a first low-criticality application. During that same execution frame, a second processing element executes both the high-criticality application and a second low-criticality application. The high-criticality application output from the first processing element is compared with that from the second processing element before the next execution frame, and a fault occurs when the output does not match. The low-criticality application is not duplicated or compared. This and other embodiments allow high-criticality applications to be appropriated checked while avoiding the over-dedication of resources to low-criticality applications that do not warrant self-checking.