The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Apr. 30, 2008
Robert H Bell, Austin, TX (US);
Thomas W Chen, Jr., Austin, TX (US);
Venkat R Indukuru, Austin, TX (US);
Alex E Mericas, Austin, TX (US);
Pattabi M Seshadri, Austin, TX (US);
Madhavi G Valluri, Austin, TX (US);
Robert H Bell, Austin, TX (US);
Thomas W Chen, Jr., Austin, TX (US);
Venkat R Indukuru, Austin, TX (US);
Alex E Mericas, Austin, TX (US);
Pattabi M Seshadri, Austin, TX (US);
Madhavi G Valluri, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A test system or simulator includes an integrated circuit (IC) benchmark software program that executes workload program software on a semiconductor die IC design model. The benchmark software program includes trace, simulation point, basic block vector (BBV) generation, cycles per instruction (CPI) error, clustering and other programs. The test system also includes CPI stack program software that generates CPI stack data that includes microarchitecture dependent information for each instruction interval of workload program software. The CPI stack data may also include an overall analysis of CPI data for the entire workload program. IC designers may utilize the benchmark software and CPI stack program to develop a reduced representative workload program that includes CPI data as well as microarchitecture dependent information.