The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Apr. 20, 2007
Applicants:
Tadayuki Yamaguchi, Kobe, JP;
Minoru Takayanagi, Kobe, JP;
Takeshi Matsumoto, Kasai, JP;
Tamiko Fujita, Akashi, JP;
Inventors:
Tadayuki Yamaguchi, Kobe, JP;
Minoru Takayanagi, Kobe, JP;
Takeshi Matsumoto, Kasai, JP;
Tamiko Fujita, Akashi, JP;
Assignee:
Sysmex Corporation, Kobe, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06Q 10/00 (2006.01); G01N 33/48 (2006.01); G01N 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
There is provided a quality control system capable of displaying a display screen regarding quality control of an testing, including a display control part for performing a display control of the display screen regarding the quality control, wherein the display control part displays the display screen on a display in accordance with a category of a quality control sample used by a user.