The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Sep. 30, 2008
Industrial automation interfaces integrated with enterprise manufacturing intelligence (emi) systems
Robert Joseph Mcgreevy, Oswego, IL (US);
Micheal John Pantaleano, Willoughby, OH (US);
Bruce Gordon Fuller, Edmonton, CA;
Ian Edward Tooke, Barrie, CA;
Kevin John Albert, Elm Grove, WI (US);
John Joseph Baier, Mentor, OH (US);
Jan Pingel, New Berlin, WI (US);
Robert Joseph McGreevy, Oswego, IL (US);
Micheal John Pantaleano, Willoughby, OH (US);
Bruce Gordon Fuller, Edmonton, CA;
Ian Edward Tooke, Barrie, CA;
Kevin John Albert, Elm Grove, WI (US);
John Joseph Baier, Mentor, OH (US);
Jan Pingel, New Berlin, WI (US);
Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);
Abstract
A visualization system integrated with an enterprise manufacturing intelligence (EMI) system utilizing preconfigured EMI data models, workflow reports and process event notifications to optimize a manufacturing process. The visualization system and the EMI system exchange data and information providing both systems with a broader process view than either system has independently. The visualization system can specifically target information and action requests to different classes of manufacturing personnel such as operators and engineers. Additionally, the visualization system maintains an audit log of all production identities, raw material usage, and requested corrective actions.