The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Mar. 13, 2008
Dukhyun Kim, Marietta, GA (US);
Young Sik Hur, Alpharetta, GA (US);
Jeong Hoon Kim, Seoul, KR;
Abstract
Systems and methods may be provided for transmitter calibration. The systems and methods may include providing one or more radio frequency (RF) test signals at an output of a transmitter, wherein the one or more RF test signals are based upon IQ baseband test signals, and applying an envelope detector to the one or more test signals to obtain one or more characteristic signals from the one or more RF test signals, where the one or more characteristic signals includes one or more first harmonic components and one or more second harmonic components associated with the one or more RF test signals. The systems and methods may further include analyzing the one or more second harmonic components to determine one or more IQ mismatch compensation parameters, and analyzing the one or more first harmonic components to determine one or more carrier leakage or DC offset compensation parameters.