The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2011

Filed:

Sep. 24, 2009
Applicants:

Stefan Popescu, Erlangen, DE;

Christian David, Lauchringen, DE;

Tilman Donath, Brugg, CH;

Eckhard Hempel, Fuerth, DE;

Martin Hoheisel, Erlangen, DE;

Franz Pfeiffer, Brugg, CH;

Inventors:

Stefan Popescu, Erlangen, DE;

Christian David, Lauchringen, DE;

Tilman Donath, Brugg, CH;

Eckhard Hempel, Fuerth, DE;

Martin Hoheisel, Erlangen, DE;

Franz Pfeiffer, Brugg, CH;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

An x-ray CT system that generates tomographic phase contrast or dark field exposures, has at least one grating interferometer with three grating structures arranged in series in the radiation direction, with a modular design of the second and third grating structures. The distance between the first grating structure of the x-ray source and the second grating structure (fashioned as a phase grating) of the respective grating/detector modules is adapted, depending on the fan angle, corresponding to a period of the grating structure of the x-ray source projected onto the grating detector module at a respective fan angle (φ).


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