The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Mar. 09, 2006
Vinay Murthy, San Diego, CA (US);
Alok Kumar Gupta, Encinitas, CA (US);
Seong Taek Chung, Redwood City, CA (US);
Fuyun Ling, San Diego, CA (US);
Vinay Murthy, San Diego, CA (US);
Alok Kumar Gupta, Encinitas, CA (US);
Seong Taek Chung, Redwood City, CA (US);
Fuyun Ling, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Techniques for performing frequency control in an OFDM system are described. In one aspect, frequency acquisition is performed based on a received pilot, and frequency tracking is performed based on received OFDM symbols. For frequency acquisition, an initial frequency error estimate may be derived based on the received pilot, and an automatic frequency control (AFC) loop may be initialized with the initial frequency error estimate. For frequency tracking, a frequency error estimate may be derived for each received OFDM symbol, and the AFC loop may be updated with the frequency error estimate. Frequency error in input samples is corrected by the AFC loop with the initial frequency error estimate as well as the frequency error estimate for each received OFDM symbol. In another aspect, a variable number of samples of a received OFDM symbol are selected, e.g., based on the received OFDM symbol timing, for use for frequency error estimation.